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ABB

Country: Switzerland

Tel: +41 1 317 7111
Fax: +41 1 317 7321

Keywords: Electrical systems, Automation systems, Mill drives

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Bruker AXS

BRUKER ADVANCED X-RAY SOLUTIONS GMBH
Oestliche Rheinbrueckenstr. 49, D-76187 Karlsruhe, Germany

The Company:

Worldwide activities of Bruker AXS Advanced X-ray Solutions GmbH include the production, R & D, sales and services of X-ray analytical systems which are used in a broad range of Industry, Research and Development applications for non-destructive multi-element and structure analysis. The D4 ENDEAVOR is part of our Diffraction Solutions for structure and phase analysis. For multielemental analysis our S4 EXPLORER, S4 PIONEER, and the S2 RANGER are the Spectrometry Solutions. For both methods we offer competent analytical solutions from R & D and Exploration to Process & Quality Control, Waste Management, and Environmental Protection.

Diffraction Solutions:

The D4 ENDEAVOR combines state-of-the-art X-ray diffraction technology and extreme versatility with a revolutionary sample handling concept for 66 up to 120 samples with easy operation and minimum size. The D4 ENDEAVOR is designed to provide highest analytical power in a very small footprint, covering all analytical tasks from qualitative and quantitative phase analysis, micro-strain and crystallite size determination, residual stress analysis to crystal structure solution and refinement. New developments in quantitative Rietveld analysis offer new insights into in the field of minerals and ores.

Spectrometry Solutions:

The S4 spectrometer family (Be -U) combines the high analytical performance and flexibility of a wavelength dispersive X-ray spectrometer, such as high reproducibility and sensitivity for light element analysis, and the advantages of space saving and cost efficiency. All S4 spectrometers are precalibrated for "standardless" XRF analysis. Any sample - metal cuttings, ores, minerals, rock pieces, slurries or even solid and liquid fuels - can be analyzed with this uniform precalibrated screening method.

The "Plug´n Analyze" S4 EXPLORER fits everywhere, whether in the clean environment of the lab or in the rugged surroundings of the production site, just what is to be expected from a proper space saving spectrometer. The installation is fast and simple due to the total Automatic setup and Calibration System (ACS). Based on unique 1kW technology concept running costs are minimal since the of S4 EXPLORER doesn't require compressed air, cooling water or detector gas.

S4 EXPLORER multielement XRF analyzer
Figure: S4 EXPLORER multielement XRF analyzer

The "Leading 4K" S4 PIONEER is the ideal spectrometry solution for all applications requiring short analysis times and high sample throughput. The S4 PIONEER not only meets the demands for space saving, but also brings an efficient and economical solution to high power excitation at 4kW by simply connecting it to an external cooling water system.

The "Touch´n Analyze" S2 RANGER is the latest member of the Spectrometry Solutions family serving for elemental analyses (Na - U) in solids, powders and liquids. Elemental analysis with the S2 RANGER means easier than ever operation through the intuitive touch-screen interface and more convenient than ever based on an all-in-one instrument combined with revolutionary new evaluation methods for routine samples and totally unknown materials.

Country: Germany

Web: www.bruker-axs.de
Email: info@bruker-axs.de
Tel: +49 7215952888
Fax: +49 7215954587

Keywords: X-ray analysis

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IMA ENGINEERING LTD

Country: Finland

Tel: +358 9 8678 100
Fax: +358 9 8678 1020

Keywords: On-line mineral analysis, On-line mine analyzers

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IMSOC

Country: Sweden

Tel: +46 70 333543

Keywords: Image analysis, Mineral flotation

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INDUSTRIAL TOMOGRAPHY SYSTEMS

Country: UK

Tel: +44 161 832 9297
Fax: +44 161 839 5195

Keywords: Instrumentation Process analysis, Tomography

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J.M. MCANTY INTERNATIONAL LTD

Country: Ireland

Tel: +353 18829621
Fax: +353 18829622

Keywords: Particle sizing, Sightglasses, Process control

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PANALYTICAL

Country: Netherlands

Tel: +31 546534444
Fax: +31 546534598

Keywords: X-Ray diffraction and fluorescence

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